A scanning electron microscope
(SEM) is a microscope that works by scanning a focused electron beam on a
sample of interest. The main SEM components include:
• Electronic source
• Electronic travels through
electromagnetic lenses
• Electronic detectors
•Sample room
• The computer and the monitor
can view the image
An electron is generated at the
top of the column, accelerating down and passing through a combination of lens
and aperture to produce a focused electron beam that strikes the surface of the
sample. The sample is mounted on the stage of the chamber area unless the
microscope is designed to operate under low vacuum, otherwise, the column and
chamber are evacuated by means of a combination of pumps. The degree of vacuum
will depend on the design of the microscope.
The position of the electron
beam on the sample is controlled by a scan coil located above the objective
lens. These coils allow the beam to be scanned on the surface of the sample.
For SEM Services in Pakistan SEM Services in Lahore. According
to the name of the microscope, this beam scanning or scanning makes it possible
to collect information about the area defined in the sample. As a result of the
electron-sample interaction, many signals are generated. These signals are then
detected by appropriate detectors.
No comments:
Post a Comment